Scientific Program


Sprite chemistry and their impact in the upper atmosphere of the Earth
Convenors: T. Neubert (Danish Space Science Center)
 F. J. Gordillo-Vazquez (CSIC, Madrid)

Lightning in the stratosphere (10 - 40 km) and mesosphere (40 - 90 km) above severe thunderstorms were discovered by the scientific community in 1989. They take a variety of forms, with one being the Sprite, which is a weakly ionized plasma lasting 10 ms to 100 ms. Sprites are thought to be generated by the transient electric field in the mesosphere following a positive cloud-to-ground discharge. Sprites have now been observed in many regions of the world, including Europe. Today, a vigorous international community for sprite research has emerged. One of the questions under study is to what extent Sprites influence atmospheric chemistry, including modifications to trace gas concentrations, such as nitride oxides, which are important catalytic pathways for the destruction of ozone and participate in the oxidation of a number of chemical species. The aim of this workshop is to bring together researchers from the Sprite and plasma science communities in order to create an environment able to stimulate the debate on air plasma chemistry under the conditions of Sprite discharges. Presentations are invited on laboratory experiments and observations of lightning and Sprites that have a bearing on associated chemical changes or will help place conditions on models of chemical changes. Also invited are theoretical and modelling papers.

17.00 h   Z. Lj. PETROVIC, Institute of Physics, Serbia  
Thermalization of high energy electrons in pure N2 at high altitude
17.20 h F. J. GORDILLO-VÁZQUEZ, CSIC, Spain  
Electron distribution function and transport coefficients relevant for air plasmas in the upper atmosphere
17.40 h E. ARNONE, Universitá di Bologna, Italy  
Mipas/Envisat spectroscopic observations of regions of high likelihood of sprite occurrence
18.00 h C. F. ENELL, University of Oulu, Finland  
Coupled ion-neutral modelling of middle and upper atmospheric transient chemical effects
18.20 h Y. HIRAKI, Nagoya University, Japan  
Chemistry of sprite discharges through electron impact and ion-neutral reaction processes
18.40 h T. NEUBERT, National Space Center, Danish Technical University, Denmark  
Optical emissions, electric fields and electron energies in sprite streamers heads
19.00 h D. D. SENTMAN, Geophysical Institute, University of Alaska, USA  
Chemical effects of weak electric fields in the trailing columns of sprite streamers
19.20 h

G. MILIKH, University of Maryland, USA  
Model of UV flashes due to gigantic blue gets



Diagnostics of active species in plasma deposition of thin films
Convenor: F. L. Tabarés (CIEMAT, Madrid)

Understanding the underlying mechanism for thin film formation from gas phase processing implies an exhaustive characterization of the relevant active species. These species are intrinsically unstable and their low concentrations are particularly challenging for plasma diagnostics. The interaction between the plasma and the deposition substrate involves in general a large amount of concurrent intertwined processes, whose combined effects are difficult to unravel. The interplay between deposition and erosion ultimately responsible for film growth, and the actual morphology and properties of the formed films, are often determined by synergies between several of the participating species which are in turn dependent on the physical characteristics of the plasma and of the substrate. Despite many efforts, the basic mechanisms are often poorly known and the optimization of film growth for technical applications is usually dealt with empirically. The aim of this workshop is to review the state of the art in this difficult task. New concepts with potential application to plasma characterization as well as the performance and limitations of more conventional ones are welcome. Presentations are invited on innovative laboratory diagnostics of species during plasma deposition of thin films with an impact in the present understanding of plasma-surface interaction processes and thin film deposition of different types of materials.

17.00 h   J. L. S. LINO, Universida de Braz Cubas, Brasil  
Elastic electron scattering by atoms and molecules using the Schwinger variatonal principle with plane waves as a trial basis set
17.20 h J. PÉREZ-LUNA, LAPLACE CNRS – Université Paul Sabatier, France  
Means of investigation of laser induced fluorescence measurements in low-pressure plasmas
17.40 h P. D. MAGUIRE, University of Ulster, U. K.   
Pressure dependence of the ion energy distribution for light and heavy ions measured at the RF-driven electrode
18.00 h I. TANARRO, CSIC, Spain  
Ion energy distributions for the identification of active species and processes in low pressure hollow cathode discharges
18.20 h F. L. TABARÉS, CIEMAT, Spain  
Characterizing minority species in reactive plasmas by Cryotrap-Assisted Mass Spectrometry (CTAMS)
18.40 h A. CONSOLI, Ruhr-University Bochum, Germany  
Dust particle formation in an argon/helium/acetylene discharge
19.00 h M. MOZETIC, Jozef Stefan Institute, Slovenia  
Determination of the neutral atom density in weakly ionized plasmas with catalytic probes
19.20 h I. STEFANOVIC, Ruhr-University Bochum, Germany  
Plasma temperatue of complex plasma from emission spectroscopy

Please remember that those contributors wishing to present their paper in any of these two workshops are kindly asked to indicate it in the abstract submission form.

The deadline for submitting abstracts is March 1st, 2008. When submitting the abstract, indicate if workshop (oral) or poster presentation is preferred. Contributions not accepted for workshop oral presentations will be presented as regular contributed papers in poster sessions. Contributor of accepted workshop oral presentations will be invited to submit a full paper for a special issue of Plasma Sources Science and Technology (PSST). The notification of acceptance will be sent by March 15, 2008. The full paper must be submitted before June 30th, 2008. Submitted papers will be subject to the usual peer review process.


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